国際会議
[1] Kazuhiro Yamashita, Changyun Huang, Meiyappan Nagappan, Yasutaka Kamei, Audris Mockus, Ahmed E. Hassan, and Naoyasu Ubayashi, "Thresholds for Size and Complexity Metrics: a Case Study from the Perspective of Defect Density," In Proceedings of International Conference on Software Quality, Reliability & Security (QRS), pages 191-201, August 2016.