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K. E. Bennin, K. Toda, Y. Kamei, J. Keung, A. Monden, and N. Ubayashi, "Empirical Evaluation of Cross-Release Effort-Aware Defect Prediction Models," In Proceedings of the 2016 IEEE International Conference on Software Quality, Reliability & Security (QRS 2016), 2016. | |
ID | 427 |
分類 | 国際会議 |
タグ | cross-release defect effort-aware empirical evaluation models prediction |
表題 (title) |
Empirical Evaluation of Cross-Release Effort-Aware Defect Prediction Models |
表題 (英文) |
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著者名 (author) |
Kwabena Ebo Bennin,Koji Toda,Yasutaka Kamei,Jacky Keung,Akito Monden,Naoyasu Ubayashi |
英文著者名 (author) |
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編者名 (editor) |
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編者名 (英文) |
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キー (key) |
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書籍・会議録表題 (booktitle) |
Proceedings of the 2016 IEEE International Conference on Software Quality, Reliability & Security (QRS 2016) |
書籍・会議録表題(英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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組織名 (organization) |
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出版元 (publisher) |
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出版元 (英文) |
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出版社住所 (address) |
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刊行月 (month) |
0 |
出版年 (year) |
2016 |
採択率 (acceptance) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 利用できません. |
BiBTeXエントリ |
@inproceedings{id427, title = {Empirical Evaluation of Cross-Release Effort-Aware Defect Prediction Models}, author = {Kwabena Ebo Bennin and Koji Toda and Yasutaka Kamei and Jacky Keung and Akito Monden and Naoyasu Ubayashi}, booktitle = {Proceedings of the 2016 IEEE International Conference on Software Quality, Reliability \& Security (QRS 2016)}, month = {0}, year = {2016}, } |