K. E. Bennin, K. Toda, Y. Kamei, J. Keung, A. Monden, and N. Ubayashi, "Empirical Evaluation of Cross-Release Effort-Aware Defect Prediction Models," In Proceedings of the 2016 IEEE International Conference on Software Quality, Reliability & Security (QRS 2016), 2016.
ID 427
分類 国際会議
タグ cross-release defect effort-aware empirical evaluation models prediction
表題 (title) Empirical Evaluation of Cross-Release Effort-Aware Defect Prediction Models
表題 (英文)
著者名 (author) Kwabena Ebo Bennin,Koji Toda,Yasutaka Kamei,Jacky Keung,Akito Monden,Naoyasu Ubayashi
英文著者名 (author) ,,,,,
編者名 (editor)
編者名 (英文)
キー (key) ,,,,,
書籍・会議録表題 (booktitle) Proceedings of the 2016 IEEE International Conference on Software Quality, Reliability & Security (QRS 2016)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) 0
出版年 (year) 2016
採択率 (acceptance)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@inproceedings{id427,
         title = {Empirical Evaluation of Cross-Release Effort-Aware Defect Prediction Models},
        author = {Kwabena Ebo Bennin and Koji Toda and Yasutaka Kamei and Jacky Keung and Akito Monden and Naoyasu Ubayashi},
     booktitle = {Proceedings of the 2016 IEEE International Conference on Software Quality, Reliability \& Security (QRS 2016)},
         month = {0},
          year = {2016},
}